Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1993-02-17
1995-05-02
Limanek, Robert P.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
382145, 348135, G06K 900
Patent
active
054124778
ABSTRACT:
A lead-bend measuring apparatus comprising: an illuminating device for projecting light onto leads projecting from a package of an integrated circuit device; an imaging device for imaging light reflected from and transmitted through the leads; a cutout device for fetching an image of the imaged light and dividing the image into a plurality of sections; a binarization processing device for processing gradations of the image with different binarization levels for each of the divided sections; a profile counter device for preparing profiles of various portions of the leads corresponding to the respective sections from binarized data subjected to processing by the binarization processing device; a calculating device for calculating a deviation of each of the prepared profiles from a reference profile and determining an amount of bend of each of the leads; and a device for determining a non-defective or defective state by making a comparison between the amount of bend calculated and allowable values. The respective sections are processed by corresponding binarization levels to measure the bend of leads, so that clear binarized images are obtained even if the illuminance of the various portions of the leads is not uniform.
REFERENCES:
patent: 4995157 (1991-02-01), Hall
patent: 5007097 (1991-04-01), Mizuoka et al.
patent: 5168528 (1992-12-01), Field, Jr.
patent: 5249239 (1993-09-01), Kida
patent: 5259042 (1993-11-01), Matsuki et al.
Hardy David B.
Limanek Robert P.
NEC Corporation
LandOfFree
Apparatus for measuring bend amount of IC leads does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for measuring bend amount of IC leads, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for measuring bend amount of IC leads will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1141627