Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1997-02-06
1998-09-15
Font, Frank G.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 25055939, 2505594, 348126, 348132, 382145, G01N 2100, G01B 1100, H04N 718
Patent
active
058087443
ABSTRACT:
An apparatus for inspecting repetitive patterns includes a signal generation device for outputting a signal every time each of repetitive patterns reaches a predetermined observation area, and a flash generation device for generating a flash in synchronism with the signal to instantaneously illuminate each of the patterns sequentially reaching the observation area. The signal generation device may be a device for generating a signal upon detecting the predetermined shape of each pattern. The repetitive patterns may be those on a tape carrier which moves, e.g., in the longitudinal direction thereof. It is preferable to provide an image pickup device for picking up the image of each repetitive pattern on the observation area and a display device for displaying the picked-up image. The display device preferably keeps display of the picked-up image of each of the patterns illuminated by the flash for a predetermined period of time within between this illumination and the next illumination by the next flash.
REFERENCES:
patent: 4305658 (1981-12-01), Yoshida
patent: 4486776 (1984-12-01), Yoshida
patent: 4864631 (1989-09-01), Jensen
patent: 4896211 (1990-01-01), Hunt et al.
patent: 5457490 (1995-10-01), Doane
patent: 5581074 (1996-12-01), Yoshida
Font Frank G.
Mitsui Mining & Smelting Co. Ltd.
Vierra-Eisenberg Jason D.
LandOfFree
Apparatus for inspecting repetitive patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for inspecting repetitive patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for inspecting repetitive patterns will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-93901