Test circuit for semiconductor integrated circuit

Test circuit for testing a synchronous memory circuit

Test circuit method and apparatus

Test circuit of semiconductor integrated circuit

Test circuit provided with built-in self test function

Test circuit topology reconfiguration and utilization...

Test circuit, integrated circuit, and test method

Test circuitry for determining the defect density of a semicondu

Test circuits for testing inter-device FPGA links including...

Test circuits of semiconductor memory device for multi-chip...

Test clock generation for higher-speed testing of a...

Test clocking scheme

Test compaction using linear-matrix driven scan chains

Test component and method of operation thereof

Test configuration and method for testing a digital...

Test data compression method for system-on-chip using...

Test data generating system and method to test high-speed...

Test data generating system and method to test high-speed...

Test data generator

Test data generator, test system and method thereof