Test circuit of semiconductor integrated circuit

Details Test circuit of semiconductor integrated circuit Test circuit of semiconductor integrated circuit

2005-08-09

2005-08-09

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S724000, C714S025000, C365S051000, C365S063000

Reexamination Certificate

active

06928596

ABSTRACT:
A test code is input to a test mode control circuit so that the test mode control circuit creates the test decode signal. The test decode signal is converted into serial data with a parallel·serial converting circuit in synchronization with a base clock. The serial data is input to a serial·parallel converting circuit located in the vicinity of the test code latch circuit dispersed on the semiconductor chip via one very long serial data line extending from end to end of the semiconductor chip.

REFERENCES:
patent: 4975641 (1990-12-01), Tanaka et al.
patent: 5110754 (1992-05-01), Lowrey et al.
patent: 5341383 (1994-08-01), Shikatani et al.
patent: 5806084 (1998-09-01), Lin et al.
patent: 5914968 (1999-06-01), Keeth
patent: 5943285 (1999-08-01), Kohno
patent: 6438013 (2002-08-01), Wakasugi et al.
patent: 6484278 (2002-11-01), Merritt et al.
patent: 6-201795 (1994-07-01), None
patent: 11-353900 (1999-12-01), None
patent: 2000-012699 (2000-01-01), None
patent: 2000-123592 (2000-04-01), None
patent: 2001-067893 (2001-03-01), None

Affiliated with

Also associated with

Rating

Test circuit of semiconductor integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test circuit of semiconductor integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuit of semiconductor integrated circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3523254