Test data generator, test system and method thereof

Details Test data generator, test system and method thereof Test data generator, test system and method thereof

2006-08-23

2009-10-27

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S738000

Reexamination Certificate

active

07610530

ABSTRACT:
A test data generator, test system and method thereof are provided. In the example method, parallel test data may be received at a first data rate. The received parallel test data may be converted into serial test data at a second data rate. Noise (e.g., jitter noise, level noise, etc.) may be selectively inserted into the converted serial test data. The noise inserted into the serial test data, which may be configured to operate at a higher data rate than the parallel test data, may allow a device to be tested with higher data-rate test data. The example method may be performed by the example test data generator and/or by the example test system.

REFERENCES:
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patent: 6381269 (2002-04-01), Gradl et al.
patent: 2004/0133834 (2004-07-01), Kanemitsu et al.
patent: 2006/0146318 (2006-07-01), Adam et al.
patent: 08-062298 (1996-03-01), None
patent: 08-062299 (1996-03-01), None
patent: 2001-289915 (2001-10-01), None
patent: 10-2003-0049481 (2003-06-01), None
Korean Office Action dated Sep. 26, 2006 for counterpart Korean Application No. 10-2005-0078044 with English translation.

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