Test circuits of semiconductor memory device for multi-chip...

Details Test circuits of semiconductor memory device for multi-chip... Test circuits of semiconductor memory device for multi-chip...

2011-06-28

2011-06-28

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S819000

Reexamination Certificate

active

07971117

ABSTRACT:
A test circuit of a semiconductor memory device for performing a test in cooperation with a tester having a plurality of input/output pins connected to a plurality of input/output lines. The test circuit may include a first comparing unit adapted to compare, on a bit-by-bit basis, read data that may be read from memory cells corresponding to an address with expected data, and to output the comparison results as first comparison signals, a second comparing unit adapted to perform a logic operation on the first comparison signals and to generate a flag signal when determining a failure of at least one of the memory cells on the basis of the operation result, and a storage unit adapted to store the first comparison signals in response to the flag signal.

REFERENCES:
patent: 4639919 (1987-01-01), Chang et al.
patent: 5384784 (1995-01-01), Mori et al.
patent: 5539702 (1996-07-01), Ahn
patent: 5644578 (1997-07-01), Ohsawa
patent: 5646948 (1997-07-01), Kobayashi et al.
patent: 5903576 (1999-05-01), Yoshiba
patent: 6119257 (2000-09-01), Negishi
patent: 6332152 (2001-12-01), Ohashi et al.
patent: 6553528 (2003-04-01), Komoike
patent: 6564237 (2003-05-01), Ohashi et al.
patent: 6691264 (2004-02-01), Huang
patent: 7024598 (2006-04-01), Jeong et al.
patent: 7119567 (2006-10-01), Ma et al.
patent: 7222272 (2007-05-01), Takazawa et al.
patent: 7360116 (2008-04-01), Nakamura
patent: 7426663 (2008-09-01), Takazawa et al.
patent: 7449909 (2008-11-01), Ma et al.
patent: 7603595 (2009-10-01), Sasaki
patent: 7673196 (2010-03-01), Yoshihara
patent: 2006/0013046 (2006-01-01), Kim et al.
patent: 2008/0101142 (2008-05-01), Nakagawa et al.
patent: 2008/0165596 (2008-07-01), Cheon et al.
patent: 63-241791 (1988-10-01), None
patent: 96-0002016 (1996-02-01), None

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