Test compaction using linear-matrix driven scan chains

Details Test compaction using linear-matrix driven scan chains Test compaction using linear-matrix driven scan chains

2011-04-12

2011-04-12

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

07925941

ABSTRACT:
A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional techniques, without reducing fault coverage.

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