LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery,Pulse or data error handling

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Semiconductor storage device and test method therefor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor storage device and test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor storage device equipped with ECC function

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Semiconductor storage device, method of controlling the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Semiconductor test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor test apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test apparatus for simultaneously testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test device and timing measurement method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test device for conducting an operation test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test management system and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test system and method for effectively testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Semiconductor test system and method, and medium for recording t

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Patent

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Semiconductor test system having double data rate pin...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test system having multitasking algorithmic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor test system supporting multiple virtual logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Semiconductor testing apparatus and method for optimizing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique

Reexamination Certificate

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Semiconductor testing apparatus and method of testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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