Semiconductor test apparatus for simultaneously testing...

Details Semiconductor test apparatus for simultaneously testing... Semiconductor test apparatus for simultaneously testing...

2005-06-15

2009-10-20

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S736000, C714S738000, C714S726000, C714S025000, C714S718000, C714S735000, C714S740000, C714S742000, C714S745000, C324S765010, C324S754090, C324S1540PB, C702S120000, C702S121000, C702S118000

Reexamination Certificate

active

07607056

ABSTRACT:
Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation boards, a DUT board, a backplane board, and a power supply unit.

REFERENCES:
patent: 3597682 (1971-08-01), Hubbs et al.
patent: 4517512 (1985-05-01), Petrich et al.
patent: 4760329 (1988-07-01), Andreano
patent: 5581177 (1996-12-01), Hussey et al.
patent: 5600257 (1997-02-01), Leas et al.
patent: 5841787 (1998-11-01), Warring et al.
patent: 6014764 (2000-01-01), Graeve et al.
patent: 6075374 (2000-06-01), Dakeyama
patent: 6256760 (2001-07-01), Carron et al.
patent: 6275962 (2001-08-01), Fuller et al.
patent: 6462532 (2002-10-01), Smith
patent: 6545493 (2003-04-01), Iino
patent: 6594802 (2003-07-01), Ricchetti et al.
patent: 6622103 (2003-09-01), Miller
patent: 6622272 (2003-09-01), Haverkamp et al.
patent: 6625557 (2003-09-01), Perkins et al.
patent: 6625558 (2003-09-01), Van Ausdall et al.
patent: 6704897 (2004-03-01), Takagi
patent: 6883128 (2005-04-01), Kang et al.
patent: 6941243 (2005-09-01), Maciona et al.
patent: 6998863 (2006-02-01), Miller
patent: 7019547 (2006-03-01), Aghaeepour
patent: 7058865 (2006-06-01), Mori et al.
patent: 7068942 (2006-06-01), Hofmeister et al.
patent: 7092837 (2006-08-01), Lanier et al.
patent: 7103761 (2006-09-01), Larson et al.
patent: 7117410 (2006-10-01), Borders
patent: 7145489 (2006-12-01), Chun
patent: 7173438 (2007-02-01), Pooranakaran et al.
patent: 7191368 (2007-03-01), Organ et al.
patent: 7206947 (2007-04-01), Krishnamurthy et al.
patent: 7272774 (2007-09-01), Co et al.
patent: 7375542 (2008-05-01), Teneketges
patent: 2002/0118007 (2002-08-01), Mori et al.
patent: 2003/0046476 (2003-03-01), Chong
patent: 2003/0062888 (2003-04-01), Magliocco et al.
patent: 2003/0099139 (2003-05-01), Abrosimov et al.
patent: 2003/0117162 (2003-06-01), Watts
patent: 2003/0189430 (2003-10-01), Nuessle
patent: 2003/0208711 (2003-11-01), Frame et al.
patent: 2003/0217345 (2003-11-01), Rajsuman et al.
patent: 2004/0066207 (2004-04-01), Bottoms et al.
patent: 2004/0068699 (2004-04-01), Morris et al.
patent: 2004/0186675 (2004-09-01), Larson et al.
patent: 2004/0187060 (2004-09-01), Rohrbaugh et al.
patent: 2004/0232930 (2004-11-01), Shibuya et al.
patent: 2005/0033949 (2005-02-01), Herrmann et al.
patent: 2005/0099174 (2005-05-01), Siade et al.
patent: 2006/0001435 (2006-01-01), Teneketges
patent: 2006/0047463 (2006-03-01), Sivaram et al.
patent: 2006/0087462 (2006-04-01), Chun
patent: 2007/0011690 (2007-01-01), Gilet
patent: 2008/0022165 (2008-01-01), McKim et al.

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