Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-03-27
2007-03-27
Lamarre, Guy (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C365S201000
Reexamination Certificate
active
10613367
ABSTRACT:
A test circuit for testing a memory circuit has a data input line for providing test data and a comparator unit. The comparator unit is connected to the data input line and to the memory circuit for comparing the test data written into the memory circuit with the test data read from the memory area. The data input line is connected to the memory circuit via a data change circuit. The data change circuit is controllable depending on a result of a comparison in the comparator unit such that when an error occurs, subsequent test data can be written in an altered manner to the memory circuit.
REFERENCES:
patent: 5561671 (1996-10-01), Akiyama
patent: 5961653 (1999-10-01), Kalter et al.
patent: 6072737 (2000-06-01), Morgan et al.
patent: 6138257 (2000-10-01), Wada et al.
patent: 6442724 (2002-08-01), Augarten
patent: 6539505 (2003-03-01), Dähn
patent: 6691272 (2004-02-01), Azim
patent: 199 22 786 (2000-12-01), None
“Processor-Programmable Memory BIST for Bus-Connected Embedded Memories” by Ching-Hong Tsai and Cheng-Wen Wu This paper appears in: Proceedings of the ASP-DAC 2001, Publication Date: 2001 pp. 325-330 INSPEC Accession No. 6924510.
Beer Peter
Ohlhoff Carsten
Britt Cynthia
Greenberg Laurence A.
Lamarre Guy
Locher Ralph E.
Stemer Werner H.
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