Test apparatus and test method

Details Test apparatus and test method Test apparatus and test method

2011-07-19

2011-07-19

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

07984345

ABSTRACT:
A test apparatus compares bits included in a data sequence read from a DUT with expectation values. Comparison results are stored in a first failure memory (FM) as bit information indicating whether storage cells of the DUT are non-defective. The storage device counts the number of bits not matching the expectation values for each page, and judges for each grade/page of the DUT whether the number of bits not matching the expectation values meets the condition of that grade. Judgment results are stored in a second FM as page information indicating whether each page is non-defective for each grade. If page information of a page including a bit corresponding to a storage cell indicating that this page meets the condition of any grade is stored in the second FM, the apparatus outputs the bit information in the first FM, by changing it to a value indicating that storage cell is as non-defective.

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“Search report of Europe counterpart application”, issued on Sep. 25, 2009, p. 1-p. 10.

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