Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2011-08-23
2011-08-23
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
Reexamination Certificate
active
08006146
ABSTRACT:
Provided is a test apparatus for testing a plurality of devices under test, the test apparatus including: a data supplying section that concurrently supplies test data to the plurality of devices under test; a writing control section that controls the test data to be concurrently written to the plurality of devices under test; and a reading control section that successively reads the test data from each of the plurality of devices under test. The plurality of devices under test may be a plurality of memories under test.
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Advantest Corporation
Chen Yoshimura LLP
Kerveros James C
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