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Fully X-tolerant, very high scan compression scan test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Functional block for integrated circuit, semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional frequency testing of integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional frequency testing of integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional frequency testing of integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional pattern logic diagnostic method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional pattern logic diagnostic method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Functional testing method and circuit including means for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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