Electronic apparatus test circuit
Electronic circuit
Fault identification by voltage potential signature
Fault tolerant selection of die on wafer
Final stage clock buffer in a clock distribution network
FPGA powerup to known functional state
Gated scan output flip-flop
IC having memoried terminals and zero-delay boundary scan
IDDQ testable programmable logic arrays
Implementing reference current measurement mode within...
Information processing apparatus with a mode setting circuit
Input and output circuit
Input and output circuit of an integrated circuit and a...
Integrated circuit chip with high area utilization rate
Integrated semiconductor circuit and method for functional...
Interface controller using JTAG scan chain
Intermediate voltage sensor for CMOS circuits
Internal voltage generating circuit for preventing voltage...
Internal voltage reference for memory interface
Large scale integrated circuit