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Scan cell systems and methods

Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate

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Scan flip flop, semiconductor device, and production method...

Electronic digital logic circuitry – With test facilitating feature
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Scan flip-flop providing both scan and propagation delay...

Electronic digital logic circuitry – With test facilitating feature
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Scan-mode indication technique for an integrated circuit

Electronic digital logic circuitry – With test facilitating feature
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Segmented programmable capacitor array for improved density...

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device and test method therefor

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device having a scan path

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device that fixes a potential on an input...

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor device with speed performance measurement

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor IC with an output circuit power supply used as a s

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor integrated circuit

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor integrated circuit

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor integrated circuit

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor integrated circuit and method for testing the...

Electronic digital logic circuitry – With test facilitating feature
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Semiconductor integrated circuit and method for testing the...

Electronic digital logic circuitry – With test facilitating feature
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