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IC having memoried terminals and zero-delay boundary scan

Electronic digital logic circuitry – With test facilitating feature
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IDDQ testable programmable logic arrays

Electronic digital logic circuitry – With test facilitating feature
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Implementing reference current measurement mode within...

Electronic digital logic circuitry – With test facilitating feature
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Information processing apparatus with a mode setting circuit

Electronic digital logic circuitry – With test facilitating feature
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Input and output circuit

Electronic digital logic circuitry – With test facilitating feature
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Input and output circuit of an integrated circuit and a...

Electronic digital logic circuitry – With test facilitating feature
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Integrated circuit chip with high area utilization rate

Electronic digital logic circuitry – With test facilitating feature
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Integrated semiconductor circuit and method for functional...

Electronic digital logic circuitry – With test facilitating feature
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Interface controller using JTAG scan chain

Electronic digital logic circuitry – With test facilitating feature
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Intermediate voltage sensor for CMOS circuits

Electronic digital logic circuitry – With test facilitating feature
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Internal voltage generating circuit for preventing voltage...

Electronic digital logic circuitry – With test facilitating feature
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Internal voltage reference for memory interface

Electronic digital logic circuitry – With test facilitating feature
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