Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2007-10-23
2007-10-23
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S009000, C326S101000
Reexamination Certificate
active
11375062
ABSTRACT:
An large scale integrated circuit (LSI) includes an input buffer for adjusting a signal input to an outer input terminal; an input side selector for outputting the signal to a first output side when a normal operation is specified and to a second output side when a test operation is specified; a logic circuit for performing a specific logic process and outputting the signal; a bypass circuit for transferring the signal from the second output side of the input side selector; an output side selector for selecting and outputting the signal from the logic circuit when the normal operation is specified and selecting and outputting the signal transferred through the bypass circuit when the test operation is specified; and an output buffer for amplifying and outputting the signal from the output side selector to an outer output terminal.
REFERENCES:
patent: 6275055 (2001-08-01), Hyozo et al.
patent: 6944810 (2005-09-01), Oberle et al.
patent: 7230447 (2007-06-01), Whetsel
patent: 2000-162284 (2000-06-01), None
Takeuchi & Kubotera LLP
Tran Anh Q.
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