LandOfFree - US Patents - Listing for Electronic digital logic circuitry,With test facilitating feature

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Adjustable data loading circuit with dynamic test mode...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Adjustable data loading circuit with dynamic test mode...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Apparatus and methods for testing simultaneous...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Apparatus for controlling input termination of semiconductor...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Area efficient clock inverting circuit for design for...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Cell with fixed output voltage for integrated circuit

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuit and method for contact pad isolation

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuit and method for testing whether a programmable logic...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuit for an electronic semiconductor module

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuit for detection of hardware faults due to temporary...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuit for providing a logical output signal in accordance...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Circuits and methods for testing FPGA routing switches

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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CMOS buffer circuit having power-down feature

Electronic digital logic circuitry – With test facilitating feature

Patent

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Critical path redundant logic for mitigation of hardware...

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Debug network for a configurable IC

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Decoding circuit for wafer burn-in test

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Digital signal transition splitting method and apparatus

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Domino scan architecture and domino scan flip-flop for the testi

Electronic digital logic circuitry – With test facilitating feature

Patent

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Dual mode analog differential and CMOS logic circuit

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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Dynamic voltage and frequency management

Electronic digital logic circuitry – With test facilitating feature

Reexamination Certificate

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