Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2005-09-27
2005-09-27
Le, Don (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S083000, C326S057000
Reexamination Certificate
active
06949946
ABSTRACT:
An integrated semiconductor circuit includes pad cells each having a connecting pad and an output driver. A transmission response of the pad cells is to be tested in a test mode. A signal transmitter is provided in order to produce periodic signal sequences. A periodic output signal from the signal transmitter is supplied as an input signal to an input of a pad cell to be tested. Through the use of an appropriate periodic signal at an output of the pad cell, the transmission response of the pad cell is tested in a frequency domain using a measurement method which employs a spectrum analyzer. This avoids complex measurements in the time domain, which have been carried out heretofore.
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Infineon - Technologies AG
Le Don
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