Segmented programmable capacitor array for improved density...

Details Segmented programmable capacitor array for improved density... Segmented programmable capacitor array for improved density...

2004-10-13

2009-08-04

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S037000, C326S039000, C326S040000, C326S042000, C326S044000, C714S025000, C714S036000, C714S037000, C714S733000, C714S726000, C714S750000

Reexamination Certificate

active

07570076

ABSTRACT:
A capacitor circuit and method to reduce layout area, leakage current, and to improve yield is disclosed. The circuit includes an output terminal (100), a plurality of circuit elements (322, 326, 330), and a plurality of transistors (320, 324, 328). Each transistor has a control terminal (314, 316, 318) and a current path coupled between the output terminal and a respective circuit element of the plurality of circuit elements. A control circuit (300) has a plurality of output terminals (314, 316, 318). Each output terminal is coupled to the control terminal of a respective transistor of the plurality of transistors. The control circuit produces control signals at respective output terminals to selectively turn off at least one transistor and turn on at least other transistors of the plurality of transistors at a first time.

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