Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2011-08-30
2011-08-30
Cho, James (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S026000
Reexamination Certificate
active
08008943
ABSTRACT:
A semiconductor device includes a plurality of pads configured to receive a plurality of external signals, an internal circuit configured to perform a predetermined internal operation in response to one of the external signals that is inputted through one of the plurality of pads, and a signal transferring unit configured to receive the external signal, output the external signal to an internal circuit an output signal during a normal mode, and output a fixed signal regardless of changes in the external signal to the internal circuit in a test mode.
REFERENCES:
patent: 7218134 (2007-05-01), Ho
patent: 7714612 (2010-05-01), Pertijs
patent: 7770084 (2010-08-01), Whetsel
Lee Kang-Seol
Yun Tae-Sik
Cho James
Hynix / Semiconductor Inc.
IP & T Group LLP
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