Scan-mode indication technique for an integrated circuit

Details Scan-mode indication technique for an integrated circuit Scan-mode indication technique for an integrated circuit

2005-10-25

2005-10-25

Tran, Anh Q. (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S009000, C326S014000

Reexamination Certificate

active

06958622

ABSTRACT:
An integrated circuit and method for indicating the integrated circuit to enter into a scan mode are disclosed. A designated signal, such as an analog supply signal, for an analog block of an integrated circuit is utilized for indicating entry of a digital block of the integrated circuit into a scan mode. Operations of the analog block and the digital block are generally independent from each other during scan mode. Prior to the digital block utilizing the designated signal, voltage rails for the designated signal are resolved with the voltage rails of a digital supply signal for the digital block.

REFERENCES:
patent: 6597191 (2003-07-01), Oosawa et al.
patent: 2004/0095182 (2004-05-01), Tomari et al.

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