Semiconductor device with speed performance measurement

Details Semiconductor device with speed performance measurement Semiconductor device with speed performance measurement

2011-03-22

2011-03-22

Barnie, Rexford N (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S012000, C326S046000, C326S093000

Reexamination Certificate

active

07911221

ABSTRACT:
A speed performance measurement circuit that may perform speed performance measurement is provided between a first logic circuit and a second logic circuit. The speed performance measurement circuit includes a first flip flop that stores first data, a first delay circuit that delays the first data and generates second data, and a second flip flop that stores the second data. Furthermore, the speed performance measurement circuit includes a first comparator circuit that compares output of the first flip flop to output of the second flip flop, and a third flip flop that stores output data from the first comparator circuit in accordance with timing of the first clock signal. Data in a normal path is compared to data in a path delayed by a certain time to measure speed, and power voltage of a circuit is determined based on such comparison. Thus, change in speed with respect to power voltage in a critical path can be measured.

REFERENCES:
patent: 2003/0117853 (2003-06-01), Mimura
patent: 2006/0220716 (2006-10-01), Nicolaidis
patent: 2007/0164787 (2007-07-01), Grochowski et al.
patent: 2007/0262787 (2007-11-01), Chakraborty et al.
patent: 2003-273234 (2003-09-01), None

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