Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2011-01-11
2011-01-11
Cho, James (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S056000
Reexamination Certificate
active
07868647
ABSTRACT:
A semiconductor device includes a plurality of pads configured to receive a plurality of external signals, an internal circuit configured to perform a predetermined internal operation in response to one of the external signals that is inputted through one of the plurality of pads, and a signal transferring unit configured to receive the external signal, output the external signal to an internal circuit an output signal during a normal mode, and output a fixed signal regardless of changes in the external signal to the internal circuit in a test mode.
REFERENCES:
patent: 6615289 (2003-09-01), Feurle et al.
patent: 7131042 (2006-10-01), Choi
patent: 7408368 (2008-08-01), Banno
patent: 09-211074 (1997-08-01), None
patent: 2004-178672 (2004-06-01), None
patent: 2006-261750 (2006-09-01), None
Notice of Preliminary Rejection issued from Korean Intellectual Property Office on Dec. 21, 2009.
Notice of Allowance issued from Korean Intellectual Property Office on May 20, 2010.
Lee Kang-Seol
Yun Tae-Sik
Cho James
Hynix / Semiconductor Inc.
IP&T Group LLP
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