Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2008-07-18

2009-12-29

Tran, Anh Q (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S009000, C326S014000

Reexamination Certificate

active

07639036

ABSTRACT:
A semiconductor integrated circuit having a test circuit for inspecting states of connections between a plurality of pads and respective external terminals by bonding wires. The test circuit comprises, for each of a plurality of pads, a control terminal provided to receive a control signal of a logic level equal to the logic level of a signal applied to a corresponding one of the external terminals, an inverter which inverts the logic level on the control terminal, an inverted output terminal of the inverter being connected to the pad via a connection line; and an exclusive-NOR gate which outputs an exclusive NOR of the logic level on the connection line and the logic level on the control terminal.

REFERENCES:
patent: 2005/0122297 (2005-06-01), Imagawa et al.
patent: 2006/0061376 (2006-03-01), Van De Logt et al.
patent: 05-275621 (1993-10-01), None
patent: 11-237441 (1999-08-01), None
patent: 2000-193709 (2000-07-01), None

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