Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2011-06-28

2011-06-28

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C324S754010, C714S733000

Reexamination Certificate

active

07969180

ABSTRACT:
A semiconductor integrated circuit includes first and second bump pads configured to output data, a probe test pad coupled to the first bump pad, and a pipe latch unit configured to selectively transfer data loaded on first and second data lines to one of the first and second bump pads in response to a pipe output dividing signal during a normal mode, and sequentially transfer the data loaded on the first and second data lines to the probe test pad in response to the pipe output dividing signal during a test mode.

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