Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2007-05-15
2007-05-15
Tran, Anh Q. (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S038000, C326S041000
Reexamination Certificate
active
11036074
ABSTRACT:
Methods and apparatus for testing programmable integrated circuits are provided. Programmable integrated circuits include programmable elements that are loaded with configuration data to program programmable logic to perform a custom logic function. The programmable integrated circuits receive test configuration data from a tester to program the programmable logic into a test configuration. After the programmable integrated circuit has been placed into the test configuration by loading the test configuration data, test vectors are applied to the programmable integrated circuit to evaluate its performance. Test configuration data loading circuits are used in the programmable integrated circuits to control how the test configuration data is loaded into the programmable elements. When the adjustable circuits are placed in a low bandwidth configuration, relatively few input lines are used to load the test configuration data. When the adjustable circuits are placed in a high bandwidth configuration, test data can be loaded quickly.
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Altera Corporation
Tran Anh Q.
Treyz G. Victor
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