Dynamic voltage and frequency management

Details Dynamic voltage and frequency management Dynamic voltage and frequency management

2011-03-29

2011-03-29

Tran, Anh Q (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S009000, C326S033000

Reexamination Certificate

active

07915910

ABSTRACT:
In one embodiment, an integrated circuit includes a self calibration unit configured to iterate a test on a logic circuit in the integrated circuit at respectively lower supply voltage magnitudes until the test fails. A lowest supply voltage magnitude at which the test passes is used to generate a requested supply voltage magnitude for the integrated circuit. In an embodiment, an integrated circuit includes a series connection of logic gates physically distributed over an area of the integrated circuit, and a measurement unit configured to launch a logical transition into the series and detect a corresponding transition at the output of the series. The amount of time between the launch and the detection is used to request a supply voltage magnitude for the integrated circuit.

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