Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2008-09-22
2010-06-01
Tran, Anh Q (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S009000, C326S014000, C326S039000, C326S041000
Reexamination Certificate
active
07728617
ABSTRACT:
Some embodiments of the invention provide a configurable integrated circuit (IC) that includes several configurable circuits grouped in several tiles. The configurable IC also includes a configuration network for loading configuration data into the IC, where the configuration data is for configuring several of the configurable circuit. In some embodiments, the configuration network includes several registers at several boundaries between the tiles, where the registers allow multiple configuration data sets to be routed to multiple tiles concurrently. The configuration network in some embodiments includes several address counters at several tiles, where each address counter allows one address to be loaded for a tile and then to be successively incremented based on increment instructions sent over the configuration network. At least, two different addresses specified by an address counter of a particular tile identify two different resources within the particular tile.
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Khubchandani Teju
Redgrave Jason
Adeli & Tollen LLP
Tabula Inc.
Tran Anh Q
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