Adjustable data loading circuit with dynamic test mode...

Details Adjustable data loading circuit with dynamic test mode... Adjustable data loading circuit with dynamic test mode...

2008-01-08

2008-01-08

Tran, Anh Q. (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C326S038000, C326S041000

Reexamination Certificate

active

07317327

ABSTRACT:
Methods and apparatus for testing programmable integrated circuits are provided. Programmable integrated circuits include programmable elements that are loaded with configuration data to program programmable logic to perform a custom logic function. The programmable integrated circuits receive test configuration data from a tester to program the programmable logic into a test configuration. After the programmable integrated circuit has been placed into the test configuration by loading the test configuration data, test vectors are applied to the programmable integrated circuit to evaluate its performance. Test configuration data loading circuits are used in the programmable integrated circuits to control how the test configuration data is loaded into the programmable elements. When the adjustable circuits are placed in a low bandwidth configuration, relatively few input lines are used to load the test configuration data. When the adjustable circuits are placed in a high bandwidth configuration, test data can be loaded quickly.

REFERENCES:
patent: 6028798 (2000-02-01), Roohparvar
patent: 6189115 (2001-02-01), Whetsel
patent: 6202185 (2001-03-01), Lee
patent: 6304094 (2001-10-01), Gilliam
patent: 6481000 (2002-11-01), Zaveri
patent: 6680871 (2004-01-01), Price
patent: 6834375 (2004-12-01), Stine
patent: 6842039 (2005-01-01), Guzman et al.
patent: 7218134 (2007-05-01), Ho

Affiliated with

Also associated with

Rating

Adjustable data loading circuit with dynamic test mode... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Adjustable data loading circuit with dynamic test mode..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Adjustable data loading circuit with dynamic test mode... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2815683