Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2003-05-15
2008-12-02
Tran, Anh Q (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S009000, C326S012000
Reexamination Certificate
active
07459928
ABSTRACT:
The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.
REFERENCES:
patent: 4870345 (1989-09-01), Tomioka
patent: 5099501 (1992-03-01), Sarkoezi
patent: 5444404 (1995-08-01), Ebzery
patent: 5574853 (1996-11-01), Barch
patent: 6456113 (2002-09-01), Kanba
Da Silva Patrick
Souef Laurent
NXP B.V.
Tran Anh Q
Zawilski Peter
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