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Capacitor circuit structure for determining overlay error

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Characteristic-evaluating storage capacitors

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Charge collector structure for detecting radiation induced charg

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Charging sensor method and apparatus

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Chemical-mechanical polishing proximity correction method...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Chip damage detecting circuit for semiconductor IC

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Circuit and method for configuring a redundant bond pad for prob

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Circuit and method for predicting failure rates in a semiconduct

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Circuit, structure and method of testing a semiconductor, such a

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Combination test structures for in-situ measurements during fabr

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Compound semiconductor device and method for controlling...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Conductive material for integrated circuit fabrication

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Conductive structure and method of forming the structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Conductive structure in a semiconductor material

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Contact chain structure for troubleshooting EPROM memory circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Contact monitor, method of forming same and method of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Contactor system for a ball grid array device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Control layer for a nanoscale electronic switching device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Control of liner thickness for improving thermal cycle...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Corona based charge voltage measurement

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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