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IC chip package and image display device incorporating same

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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IC with comparator receiving expected and mask data from pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Impedance controlled test fixture for multi-lead surface mounted

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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In-line electrical monitor for measuring mechanical stress...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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In-line voltage contrast detection of PFET silicide...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Inline detection device for self-aligned contact defects

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Inline ground-signal-ground (GSG) RF tester

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Insert module for a test handler

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Inspectable buried test structures and methods for...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Insulated-gate semiconductor device having a position recognizin

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated circuit and a method of manufacturing an...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Integrated circuit and fabricating method and evaluating method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Integrated circuit and method of designing integrated circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit and methods of measurement and...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Integrated circuit chip carrier

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Integrated circuit chip structure for improved packaging

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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