4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure
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GaN crystal substrate

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Ground-signal-ground pad layout for device tester structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Grounding inserts

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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