Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-11-01
2005-11-01
Munson, Gene M. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S288000, C257S356000, C257S360000
Reexamination Certificate
active
06960784
ABSTRACT:
A charging sensor is provided to detect charging signal during the manufacturing process of integrated circuits and various semiconductor devices. In one embodiment, the charging sensor includes a charging-sensitive insulator layer and complementary elements designed to effectively provide an indicative potential drop across the charging sensitive insulator.
REFERENCES:
patent: 5781445 (1998-07-01), Shiue et al.
patent: 6091113 (2000-07-01), Tanaka
patent: 6265729 (2001-07-01), Nelson et al.
patent: 6747303 (2004-06-01), Schroeder
Lin Wallace W.
Sery George E.
Munson Gene M.
Schwabe Williamson & Wyatt P.C.
LandOfFree
Charging sensor method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Charging sensor method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Charging sensor method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3471988