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Abatement of electron beam charging distortion during dimensiona

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Algorithm for detecting sloped contact holes using a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Ancillary pads for on-circuit array probing composed of I/O and

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Anisotropically conductive connector and production process...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Anisotropically conductive connector and production process...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and method for detecting defects in insulative layers

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus and method for evaluating the surface insulation resis

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus and method for marking defective sections of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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APPARATUS AND METHOD FOR OPTICAL EVALUATION, APPARATUS AND...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and methods for characterizing floating body...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Apparatus and methods for determining and localization of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and methods for determining floating body effects...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Apparatus and methods for semiconductor IC failure detection

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Apparatus and methods of testing and assembling bumped...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Apparatus for and method of rapid testing of semiconductor compo

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus for assisting backside focused ion beam device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Apparatus for automatically positioning electronic dice...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Apparatus for diagnosing interconnections of semiconductor integ

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus for isolating a conductive region from a substrate dur

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Apparatus for mapping scratches in an oxide film

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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