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Selected: S

S-parameter power plane probe coupon

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Scan testing in single-chip multicore systems

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Selective state change analysis of a SOI die

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semi-conductor device with test element group for evaluation...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semi-conductor integrated circuit device including connection an

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Semiconductor alignment aid

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor apparatus with misalignment mounting detection

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor bond pad structures and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor chip

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor chip for mounting on a semiconductor package subst

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Semiconductor chip including a reference element having...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor chip with bond area

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor chip with test pads and tape carrier package...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor chip, semiconductor device, and process for...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor component and system for fabricating contacts...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor component having test contacts

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor component having test pads and method and...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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