4. Active solid-state devices (e.g., transistors, solid-state diode
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Hot carrier injection test structure and technique for statistic

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Hot carrier injection test structure and testing technique for s

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Hybrid integrated circuit device having burn-in testing means

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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