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Ball grid array package emulator

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Bare chip carrier and method for manufacturing semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Bipolar transistor characterization apparatus with lateral...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Bipolar transistor test structure with lateral test probe pads

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Bond quality indication by bump structure on substrate

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Bonding pad with separate bonding and probing areas

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Breakdown evaluating test element

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Bumped semiconductor component having test pads, and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Burn-in socket used in a burn-in test for semiconductor chips

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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