Chip damage detecting circuit for semiconductor IC

Details Chip damage detecting circuit for semiconductor IC Chip damage detecting circuit for semiconductor IC

1996-10-23

1998-03-03

Ngo, Ngan V.

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

257203, 257204, 257206, 257208, 257210, 257369, 257577, H01L 2358, H01L 2710

Patent

active

057238758

ABSTRACT:
A semiconductor integrated circuit has a chip check circuit for detecting cracks and other defects in the chip during operation. The chip check circuit extends in the chip from an input terminal to an output terminal so as to scan a predetermined wide area. The chip check circuit has at least one signal line extending near or within a circuit block in the chip so that the signal line can be broken together with the circuit block. The chip check circuit may further comprise one or more inverters, and/or one or more two-wire logic circuits.

REFERENCES:
patent: 5051690 (1991-09-01), Maly et al.
patent: 5619462 (1997-04-01), McClure
patent: 5654582 (1997-08-01), Kijima et al.
patent: 5654588 (1997-08-01), Dasse et al.

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