LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Synthesis and screening of ligands using X-ray crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for analyzing layers using x-ray transmission

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for matching diffraction patterns

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for matching diffraction patterns

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for reducing phase ambiguity of crystal...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for using X-ray diffraction to detect subsurfa

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for X-ray diffraction imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method for XRD-based threat detection

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and method to account for cross-talk among coherent...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and methods for characterizing a substance

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System and methods for x-ray backscatter reverse engineering...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for analyzing metal impurity on the surface of a single c

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for local X-ray excitation by monochromatic X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for making an on-line determination of degree of alloying

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

System for radiographically inspecting an object using backscatt

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Systems and methods for detecting an image of an object by...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Systems and methods for x-ray imaging and scanning of objects