System and method for X-ray diffraction imaging

Details System and method for X-ray diffraction imaging System and method for X-ray diffraction imaging

2008-10-31

2010-11-16

Glick, Edward J (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S006000, C378S057000, C378S071000, C378S086000

Reexamination Certificate

active

07835495

ABSTRACT:
An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.

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