System and method for using X-ray diffraction to detect subsurfa

Details System and method for using X-ray diffraction to detect subsurfa System and method for using X-ray diffraction to detect subsurfa

1996-04-01

1999-12-21

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 73, G01N 2320

Patent

active

060059133

ABSTRACT:
A system with three parts: a testing apparatus, a computer system, and a communications line between the two. The testing apparatus has a device that emits x-rays into the sample, a device to position the sample relative to the x-rays and an electro-optical x-ray detector for detecting diffracted x-rays. The computer system has a computer, a computer program, a storage device, a database, and monitor or other means of announcing the results of a test. The computer program directs the computer to accept data from the sample testing system concerning the relationships of the devices, the x-rays, and diffracted x-rays. The computer program also directs the computer to compare this data with a database of previously determined relationships and possible diffraction patterns stored in the storage device. Based on the comparison, the computer program directs the computer to announce the results of the comparison via the monitor or other means, thereby revealing the crystallographic grain structures of the sample. The method encompasses positioning the sample in a path of x-rays projecting from an x-ray means, detecting x-rays that are diffracted by the sample with an electro-optical detector, analyzing the data and announcing the crystallographic grain structures of the sample based on the analyzing step.

REFERENCES:
patent: 4696024 (1987-09-01), Pesch
patent: 4910758 (1990-03-01), Herrick
patent: 5491738 (1996-02-01), Blake et al.
Will Kleber, "Einfuhrung in die Kristallographie", VEB Verlag Technik, 11th Edition, pp. 335, 336, Berlin DE.
Green, Jr., Robert E., "X-Ray Diffraction Imaging and Analysis," Presented at American Society of Nondestructive Testing, Fall Conference, 1995.
Fitting, D.W. et al., "Real-Time Sensing of Metal Solidification Using Transmission X-Ray Diffraction," Contribution of National Institute of Standards and Technology.

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