LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Material analysis using multiple X-ray reflectometry models

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Means and method for determining residual stress on a polycrysta

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Measurement of critical dimensions using X-ray diffraction...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Measurement of critical dimensions using X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Measurement of thin films and barrier layers on patterned...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Measuring instrument for X-ray structure determinations of liqui

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Mechanically actuated double crystal monochromater

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Megavoltage scatter radiation measurement using beam stop array

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and an apparatus for examining an object by using...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for accurately measuring the distance to a

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for analysis using X-ray spectra

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for detecting a crystallographic axis of a

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for detecting boron in x-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for detecting flaws in single crystal test

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for detection of ionizing radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for determining a material of a...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for determining both density and atomic num

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for determining the position of an...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method and apparatus for diffraction measurement using a...