System and methods for characterizing a substance

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

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C378S071000, C378S086000, C378S088000

Reexamination Certificate

active

07831019

ABSTRACT:
A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line.

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