X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-12-28
2010-11-09
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S086000, C378S088000
Reexamination Certificate
active
07831019
ABSTRACT:
A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line.
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Armstrong Teasdale LLP
Morpho Detection Inc.
Sanei Mona M
Song Hoon
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