LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

SiO2-coated mirror substrate for EUV

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sliding sample cell insertion and removal apparatus for...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Small angle x-ray scattering detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Snapshot backscatter radiography (SBR) systems including...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Snapshot backscatter radiography system and protocol

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Specimen holder

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spectral type radiation imaging system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spectrometer arrangement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spectrometer for X-radiation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spherical mirror grazing incidence x-ray optics

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Spot filmer cassette transport vibration support

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Steerable x-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Stereotactic mammography system imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Stress measurement method using X-ray diffraction

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Structural parameter analyzing apparatus and analyzing method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Structured anode X-ray source for X-ray microscopy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Subassembly, method and system for monochromatizing X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Support device for a polycapillary optic

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Surface channeled X-ray tube