X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-01-24
2010-06-22
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S070000, C378S084000, C378S085000, C378S086000, C378S087000, C378S088000, C378S089000
Reexamination Certificate
active
07742564
ABSTRACT:
Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.
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Chapman Leroy D.
Connor Dean
Parham Christopher
Pisano Etta
Zhong Zhong
Brookhaven Science Associates
Ho Allen C.
Jenkins Wilson Taylor & Hunt, P.A.
The University of North Carolina at Chapel Hill
The University of Saskatchewan
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