Systems and methods for x-ray imaging and scanning of objects

Details Systems and methods for x-ray imaging and scanning of objects Systems and methods for x-ray imaging and scanning of objects

2006-11-17

2009-02-03

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S006000, C378S122000

Reexamination Certificate

active

07486772

ABSTRACT:
Systems and methods for x-ray imaging and scanning of objects are disclosed. According to one aspect, the subject matter described herein can include providing an x-ray source configured to generate a plurality of individually-controllable x-ray beams, positioning an object to be imaged in a path for intercepting at least one of the x-ray beams, activating the x-ray source, detecting intensities of the emitted x-ray beams, and generating imaging data based on the intensities for constructing an image of the object.

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