X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-10-31
2010-12-21
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S086000
Reexamination Certificate
active
07856083
ABSTRACT:
A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially from a plurality of focus points denoted by F1, F2, . . . Fnwith a running index i. The method includes measuring a diffraction profile Xkfor each coherent scatter detector Dkof the plurality of coherent scatter detectors. The diffraction profile includes a spectrum of a number of photons measured in a plurality of corresponding coherent scatter detectors. Each coherent scatter detector Dkis corrected to remove scatter from a plurality of primary beams directed to remaining coherent scatter detectors of the plurality of coherent scatter detectors.
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Harding Geoffrey
Strecker Helmut Rudolf
Armstrong Teasdale LLP
Morpho Detection Inc.
Yun Jurie
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