X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-08-30
1992-10-13
Hannaher, Constantine
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 70, G01N 2320
Patent
active
051557517
ABSTRACT:
A system for making an on-line determination of the degree of alloying in galvannealed steel sheets are provided, which includes an X-ray tube for generating X-ray, detectors for detecting the X-ray diffraction intensity of the .zeta. phase and .GAMMA. phase of Fe--Zn intermetallic compounds phases of the galvannealed steel sheet and a detector for detecting the background intensity, all of the detectors being located same plane on the surface of the galvannealed steel sheets, and further includes an arithmetic unit for receiving the outputs of the detectors to compute the X-ray diffraction intensities. Preferably, this system includes a detector for detecting the X-ray diffraction intensity of the .delta..sub.1 phase.
Chohata Kazuaki
Hirose Yusuke
Kittaka Toshiharu
Nagatani Takeshi
Saito Minoru
Hannaher Constantine
Nisshin Steel Co. Ltd.
Wong Don
LandOfFree
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